Spectroscopic ellipsometry is an optical technique used to determine the thickness and optical properties of thin films by measuring the change in polarization as light reflects off a material. It is non-destructive and highly sensitive, making it ideal for characterizing complex multilayer structures in semiconductor and photovoltaic industries.
Radar signature refers to the unique set of characteristics that an object exhibits when it reflects radar signals, allowing for its detection, identification, and classification. These characteristics are influenced by the object's size, shape, material, and motion, and are crucial in applications such as military stealth technology and air traffic control.