A secondary electron is an electron that is ejected from a material as a result of the impact of a primary electron or other high-energy particle. These electrons are important in various applications, including scanning electron microscopy and surface analysis, where they provide information about the surface composition and topography.

Secondary Electron

secondary electron

A primary electron is an electron that is initially emitted or ejected from an atom or molecule, typically due to external energy sources such as electron beams or X-rays. These electrons play a crucial role in initiating various physical processes, including secondary electron emission and the generation of electron cascades in materials.

primary electron

high-energy particle

Scanning Electron Microscopy (SEM) is a powerful imaging technique that uses a focused beam of electrons to produce high-resolution, three-dimensional images of a sample's surface. It is widely used in materials science, biology, and nanotechnology for detailed surface characterization and analysis at the micro and nanoscale levels.

scanning electron microscopy

Surface analysis is the study and characterization of the outermost layer of a material, crucial for understanding its interactions with the environment and other substances. It involves techniques that provide information about the chemical composition, structure, and properties of the surface, which are essential for applications in fields like materials science, chemistry, and engineering.

surface analysis

surface composition

Surface topography is the study of the surface features of an object or a region, including its texture, roughness, and deviations from a flat plane. It is crucial in fields such as materials science, geology, and manufacturing, where understanding surface characteristics can influence performance, wear, and aesthetic qualities.

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