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English
New Course
Concept
Atomic Force Microscopy
Atomic Force Microscopy
(AFM) is a
high-resolution imaging technique
that allows researchers to visualize surfaces at the
atomic level
by
measuring the forces
between a
sharp probe
and the
sample surface
. It is widely used in
materials science
, biology, and nanotechnology for its ability to provide topographical, mechanical, and
electrical property information
about a wide range of samples without requiring a
vacuum environment
.
Relevant Degrees
Condensed Matter Physics 63%
Nanotechnology 38%
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